Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
2017-04-21 (金) - 発売中
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)Sandeep K. Goel / Krishnendu Chakrabarty Amazonで購入する 他のショップで探す |
- 新刊発見日: 2017年04月06日
- CRC Press
- ASIN: 1138075779
- EAN: 9781138075771
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
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nanoscale
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